Characterization of Nanomaterials – Training Services

Characterization of Nanomaterials – Training Services provides in-depth training on techniques used to analyze the structural, morphological, optical, and electronic properties of nanomaterials. The program covers advanced methods such as X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM), atomic force microscopy (AFM), Fourier-transform infrared spectroscopy (FTIR), and Raman spectroscopy. Participants will learn how to interpret experimental data to understand size, shape, crystallinity, surface area, and defects in nanomaterials. Emphasis is placed on correlating characterization results with material performance in real-world applications across electronics, energy, and biomedical fields.