Atomic Force Microscopy (AFM) in Nanomaterials Analysis – Training Services

Atomic Force Microscopy (AFM) in Nanomaterials Analysis – Training Services introduces participants to the principles and applications of AFM for characterizing surface properties at the nanoscale. The training covers the working mechanism of AFM, modes of operation (contact, tapping, and non-contact), and the interpretation of topographical, mechanical, and electrical property data. Emphasis is placed on sample preparation, imaging techniques, force spectroscopy, and nanoscale manipulation. Through hands-on demonstrations, participants gain skills in analyzing nanostructures, thin films, and biomaterials, making AFM a versatile tool for nanoscience and nanotechnology research.