Atomic Force Microscopy (AFM) – Training Services

Atomic Force Microscopy (AFM) – Training Services offers comprehensive training on nanoscale imaging and surface property characterization. The course covers the working principles of AFM, probe–sample interactions, and different operational modes such as contact, tapping, and non-contact modes. Participants will gain hands-on experience in instrument setup, calibration, and image acquisition for high-resolution surface mapping. The training also explores applications in nanotechnology, materials science, polymers, semiconductors, and biological sciences. Emphasis is placed on analyzing topography, roughness, mechanical, and electrical properties at the nanoscale. By the end of the training, learners will be able to confidently utilize AFM for research, development, and quality control across diverse fields.